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Energy Dispersive X-Ray Fluorescence Spectrometer For Elements S To U

Basic Information
Place of Origin:China
Brand Name:NANBEI
Certification:CE/ISO/SGS/TUV
Model Number:NBXD-8010
Minimum Order Quantity:1/set
Packaging Details:Wooden cases and cartons
Delivery Time:7-10days
Payment Terms:L/C, D/A, D/P, T/T, Western Union, MoneyGram
Supply Ability:500 set/per day
Detail Information
Model:XD-8010Analysis Principle:Energy Dispersive X-ray Fluorescence Analysis
Elements Range:S (16) – U (92) Any ElementSample:Plastic / Metal / Film / Solid / Liquid / Powder, Etc.,  Any Size And Irregular Shape
Sample Irradiation Diameter:F1mm-F7mmSample Observation:With 300,000-pixel CCD Camera
High Light:

F1mm x ray fluorescence spectrometer

,

F7mm x ray fluorescence spectrometer

,

F7mm xrf spectrometer


Product Description

Energy Dispersive X-Ray Fluorescence Spectrometer for elements S to U

 

Applications:

Quality and Technical Supervision(Environmental directives)

RoHS/Rohs (China)/ELF/EN71

Toy

Paper, ceramics, paint, metal,etc.

Electrical and Electronic Materials

Semiconductors, magnetic materials, soldering, electronic parts, etc.

Iron and steel, non-ferrous metals

Alloys, precious metal, slag, ores,etc.

Chemical industry

Mineral products, chemical fiber, catalysts, coatings, paints,cosmetics, etc.

Environment

Soil, food, industrial waste, coal powder

Oil

Oil, lubricating oil, heavy oil, polymer, etc.

Others

Coating thickness measurement, coal, archeology, materials research and forensic etc.

Energy Dispersive X-Ray Fluorescence Spectrometer For Elements S To U 0

 

Features:

● Three different types of X-ray radiation safety systems, software interlocks,

hardware interlocks, and mechanical interlocks, will completely eliminate radiation

leakage under any working condition.

● The XD-8010 features a uniquely designed optical path that minimizes distances

between the X-ray source, sample, and detector while maintaining the flexibility to

switch between a variety of filters and collimators. This significantly improves the

sensitivity, and lowers the detection limit.

● The large volume sample chamber allows large samples to be directly analyzed

without the need for damage or pre-treatment.

● Simple, one-button analysis using a convenient and intuitive software interface.

Professional training is not required to perform basic operation of the instrument.

● The XD-8010 provides rapid elemental analysis of elements from S to U, with

adjustable analysis times.

● Up to 15 combinations of filters and collimators. Filters of various thicknesses and

materials are available, as well as collimators ranging from Φ1 mm to Φ7 mm.

● The powerful report formatting feature allows for flexible customization of the

automatically generated analysis reports. The generated reports can be saved in PDF

and Excel formats. The analysis data is automatically stored after each analysis.

Historical data and statistics can be accessed at any time from a simple query

interface.

● Using the instrument's sample camera, you can observe the position of the sample

relative to the focus of the X-ray source. Pictures of the sample are taken when

analysis begins and can be displayed in the analysis report.

● The software's spectra comparison tool is useful for qualitative analysis and material

identification and comparison.

● By using proven and effective methods of qualitative and quantitative analysis, the

accuracy of the results can be assured.

● The open and flexible calibration curve fitting feature is useful for a variety of

applications such as the detection of harmful substances.

Energy Dispersive X-Ray Fluorescence Spectrometer For Elements S To U 1Energy Dispersive X-Ray Fluorescence Spectrometer For Elements S To U 2Energy Dispersive X-Ray Fluorescence Spectrometer For Elements S To U 3Energy Dispersive X-Ray Fluorescence Spectrometer For Elements S To U 4

 

ModelXD-8010
Analysis principleEnergy dispersive X-ray fluorescence analysis
Elements RangeS (16) – U (92) any element
SamplePlastic / metal / film / solid / liquid / powder, etc., any size and irregular shape
X - ray tubeTargetMo
Tube voltage(5-50)kV
Tube current(10-1000)uA
Sample irradiation diameterF1mm-F7mm
Filter15 sets of composite filter is automatically selected, and the automatic conversion
DetectorImports from the United States Si-PIN detector
The data processing circuit boardImports from the United States, with the use of Si-PIN detector sets
Sample observationWith 300,000-pixel CCD camera
The sample chamber size490 (L)´430 (W)´150 (H)
Analysis methodLinear linear, quadratic Code lines, strength and concentration calibration correction
Operating system softwareWindows XP, Windows7
Data managementExcel data management, test reports, PDF / Excel format saved
Working environmentTemperature: £30°C. Humidity£70%
Weight55kg
Dimensions550´450´395
Power supplyAC220V±10%,50/60Hz
Determination conditionsAtmospheric environment
Contact Details
Lin

Phone Number : +86 15890601238